亚洲中文字幕成人av在线观看|人人操人人插人人爱|91超碰人人只有精品国产无卡顿|一级全黄免费试看30分钟|亚洲AV成人无码一|国产极品美女一无码一|91青涩伊人超碰久在线|91精品国际成人|AV在线播放中文|国产精品久久久久久久久久久99人

                



       The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials. 

 
Applications:

■ Microelectronics

■ Photovoltaic

 
Product's Feature:

■ High stability and accuracy

■ Laser wavelength 632.8 nm

■ Goniometer with angles of incidence set in 5o steps 

■ Multiple angle measurements 

■ Large material database 

■ Fully integrated support of multiple angle measurements for more complex applications and absolute thickness 

■ Fast and comfortable measurement at a selectable, application specific single angle of incidence

 
Technique Specification:
■ Precision of ψ, Δ at 90° (transmission) position: δ(ψ)=0.002°, δ(Δ)=0.002° 

■ Long term stability: δ(ψ)=±0.1°, δ(Δ)=±0.1° 

■ Precision of film thickness: 0.01nm  for 100 nm SiO2 on Si 

■ Precision of refractive index: 0.0005  for 100 nm SiO2 on Si

 
Typical Customer: 

American,Europe and Asia and so on.